The Zeiss Supra 40 Field Emission Scanning Electron Microscope offers high resolution imaging for biological samples with several detectors (SE2, inlens SE, STEM, BSD).
Features:
- 0.1-30kV accelerating voltage
- Secondary electron detector (SE2) for typical SEM imaging
- In column high resolution SE detector
- Backscatter electron detector for Z-contrast imaging and array tomography
- Zeiss Atlas 5 Array Tomography package for 3D image acquisition
- STEM detector for transmitted electron detection
- Gatan cryo-stage
- Inca EDS for elemental analysis
- Plasma cleaner for in-situ sample and chamber cleaning
Galley
Electron Microscopy Preparation
Forchheimer 633NB